Testing procedure, which helps to detect rare defects, which could be missed by applying standard S-on-1 test. It characterizes the worst-case scenario when it comes to large optics and defect-driven damage.
Raster scan LIDT test
Testing procedure, which helps to detect rare defects, which could be missed by applying standard S-on-1 test. It characterizes the worst-case scenario when it comes to large optics and defect-driven damage.
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